---
title: "Conversion Electron Mössbauer Spectroscopy Study of r.f. Sputtered <math>Cd0.95Fe0.05Te</math> Thin Films • CBPF Index"
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**Physics Note****Published**

# **Conversion Electron Mössbauer Spectroscopy Study of r.f. Sputtered **<math>Cd0.95Fe0.05Te⁡</math>\<math>\\operatorname{Cd\_{0.95}Fe\_{0.05}Te}\</math><math>Cd0.95​Fe0.05​Te</math>** Thin Films**

**E. Galvão da Silva; R. B. Scorzelli; F. S. Sinencio; Octavio Alvares; J.G. Mendoza-Alvarez**

1987

[**Download PDF **0.5 MB](https://index.cbpf.br/files/publicacao/6ad2a767639f62b11adbb786/pdf) [**Contact owner**](mailto:apub@cbpf.br?subject=Conversion%20Electron%20M%C3%B6ssbauer%20Spectroscopy%20Study%20of%20r.f.%20Sputtered%20%3Cmath%3ECd0.95Fe0.05Te%3C%2Fmath%3E%20Thin%20Films)

## **Publication details**

<dl>

<dt>Authors</dt>
<dd>E. Galvão da Silva; R. B. Scorzelli; F. S. Sinencio; Octavio Alvares; J.G. Mendoza-Alvarez</dd>

<dt>Type</dt>
<dd>Physics Note</dd>

<dt>Status</dt>
<dd>Published</dd>

<dt>Publication date</dt>
<dd>1987</dd>

<dt>Description</dt>
<dd>Conversion electron Mössbauer Spectroscopy (CEMS) studies have been performed on &lt;math&gt;\operatorname{Cd_{0.95}Fe_{0.05}Te}&lt;/math&gt; thin films grown by rf . sputtering on quartz and silicon substrates. The CEMS spectra show the presence of &lt;math&gt;\operatorname{Fe^{2+}}&lt;/math&gt; and &lt;math&gt;\operatorname{Fe^{3+}}&lt;/math&gt; in the films. It was studied the dependence of the population of both ions on substrate temperature, annealing temperature and substrate type</dd>

<dt>Year</dt>
<dd>1987</dd>

<dt>Number</dt>
<dd>CBPF-NF-015/87</dd>

<dt>Linked to a thesis</dt>
<dd>No</dd>

<dt>Linked to a grant</dt>
<dd>No</dd>

</dl>

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