Conversion Electron Mössbauer Spectroscopy Study of r.f. Sputtered <math>Cd0.95Fe0.05Te</math> Thin Films

Physics NotePublished

Conversion Electron Mössbauer Spectroscopy Study of r.f. Sputtered $<math>\operatorname{Cd_{0.95}Fe_{0.05}Te}</math>$ Thin Films

E. Galvão da Silva; R. B. Scorzelli; F. S. Sinencio; Octavio Alvares; J.G. Mendoza-Alvarez

1987

Authors: E. Galvão da Silva; R. B. Scorzelli; F. S. Sinencio; Octavio Alvares; J.G. Mendoza-Alvarez
Type: Physics Note
Status: Published
Publication date: 1987
Description: Conversion electron Mössbauer Spectroscopy (CEMS) studies have been performed on <math>\operatorname{Cd_{0.95}Fe_{0.05}Te}</math> thin films grown by rf . sputtering on quartz and silicon substrates. The CEMS spectra show the presence of <math>\operatorname{Fe^{2+}}</math> and <math>\operatorname{Fe^{3+}}</math> in the films. It was studied the dependence of the population of both ions on substrate temperature, annealing temperature and substrate type
Year: 1987
Number: CBPF-NF-015/87
Linked to a thesis: No
Linked to a grant: No